Date/Time
Date(s) - June 25, 2024 - June 26, 2024
8:30 am - 4:30 pm

Categories

• In-Person

Join ATA Engineering and Siemens to explore the intricacies of modal analysis and sound quality metrics during this transformative two-day seminar. This exclusive, in-person event is your gateway to an enriching experience, offering a platform to connect with likeminded professionals in the testing community.

You are invited to sign up for either one or both days of this free seminar. Our agenda is crafted to deliver valuable insights through theoretical presentations, captivating live demonstrations, and extensive networking opportunities. This event will answer questions like:

• How to identify the natural frequencies and modes of a structure?
• How to correlate and update modal simulation models?
• What are all the different sound metrics (loudness, roughness, tonality, etc) and how are they useful?
• What is the best metric to use to describe the sound I am hearing?
• How do I reduce the sound metric to a single, meaningful number?

Don’t miss your chance to join us for this unparalleled exploration of modal analysis and sound quality metrics—review the agenda and register below.

Refreshments and lunch will be provided.

SEMINAR AGENDA

DAY 1 | MODAL ANALYSIS | Tuesday, 6/25

Structural Dynamics

• Resonances
• Frequency response functions (FRFs)
• Excitation techniques (hammers, shakers, etc.)

Measurement Considerations

• Sampling rate, blocksize, acquisition time
• Bandwidth, spectral lines, frequency resolution
• Window (Hanning, flattop, etc.) and leakage
• Fast Fourier transforms (FFTs), phase, autopowers
• Autopowers vs. power spectral density (PSD)

Structural Analysis

• Modal curve-fitting techniques
• Modal synthesis
• Modal assurance criterion (MAC)

Advanced Techniques

• Modification prediction
• Accelerometer mass compensation

DAY 2 | Sound Quality Metrics | Wednesday, 6/26

Sound Quality Overview 

• Human Hearing
• A-weighting
• Decibel “Rules of Thumb”
• Decibels versus Loudness/Sones
• Stevens, DIN, vs ISO Loudness

Level Based Metrics 

• Articulation Index
• Speech Interference Level
• Sharpness

Tonal Metrics 

• Tonality
• Prominence Ratio
• Tone-to-Noise Ratio

Modulation Metrics 

• Envelope Analysis
• Roughness
• Fluctuation Strength

Transient Metrics 

• Wavelets
• N10 Loudness
• Kurtosis

Sound Quality Jury Testing

• Jury Types: AB, Semantic Differential
• Concordance versus Consistency in Jury Responses
• Preference Equation

SEMINAR LOCATION

Siemens
46871 Bayside Parkway
Building B
Fremont, CA 94538

OTHER DETAILS

This seminar is free to attend, but registration is required. Lunch and refreshments will be provided. Preapproval is required for non-US citizens.

CONTACT

If you have any questions, please contact [email protected] and [email protected].